YD/T 1763.1-2011 TD-SCDMA/WCDMA digital cellular mobile telecommunication network test methods for UICC-ME(Cu)interface—Part 1:Physical,electrical and logical characteristics of ME (English Version)
TD-SCDMA/WCDMA digital cellular mobile telecommunication network test methods for UICC-ME(Cu)interface—Part 1:Physical,electrical and logical characteristics of ME
1 Scope
This part specifies test methods and expected results of the physical, electrical and logical characteristics of the UICC-ME (Cu) interface of the ME for TD-SCDMA/WCDMA digital cellular mobile telecommunication network. The specific test items include the physical characteristics of the Cu interface, the electrical characteristics of Cu interface, the initial communication establishment, the transport protocols and application independent procedures.
This part is applicable to the test of UICC-ME (Cu) interface of the ME for TD-SCDMA mobile telecommunication network and that of UICC-ME (Cu) interface of the ME for WCDMA digital cellular mobile telecommunication network. It may be used as reference for CDMA mobile communication ME using UICC.
2 Normative References
The following documents are indispensable for the application of this standard. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
YD/T 1762.1-2011 TD-SCDMA/WCDMA Digital Cellular Mobile Telecommunication Network Technical Requirements for UICC-ME(Cu) Interface - Part 1: Physical, Electrical and Logical Characteristics
ISO/IEC 7816-3 (1997) Identification Cards - Integrated Circuit(s) Cards with Contacts - Part 3: Electronic Signals and Transmission Protocols
3 Terms, Definitions, Symbols, Abbreviations and Conventions
3.1 Terms and Definitions
For the purposes of this standard, the following terms and definitions apply.
3.1.1
3V Technology Smart Card
smart card operating at 3V±10% and 5V± 10%
3.1.2
1.8V Technology Smart Card
smart card operating at 1.8V±10% and 3V±10%
3.1.3
3V Technology Terminal
smart card operating at 3V±10% and 5V±10%
3.1.4
1.8V Technology Terminal
terminal operating the smart card-terminal Cu interface at 1.8V±10% and 3V±10%
3.1.5
Elementary File (EF)
file containing access conditions and data and no other files
3.1.6
File
organized set of bytes or records in the UICC
3.1.7
length of command data, Lc
length of the command data sent by the application layer when processing cases 3 and 4 commands using T=0 protocol
3.1.8
maximum length of response data, Le
maximum length of data expected by the application layer in response to a cases 2 and 4 command using T=0 protocol
3.1.9
length of data sent by the UICC to the terminal, Lr
length of data that the UICC sends to the terminal when processing the response to cases 2 and 4 commands using T=0 protocol
3.1.10
exact length of the data available in the UICC, LUICC
exact length of data available in the UICC to be returned in response to the cases 2 and 4 command using T=0 protocol received by the UICC
Foreword i
1 Scope
2 Normative References
3 Terms, Definitions, Symbols, Abbreviations and Conventions
3.1 Terms and Definitions
3.2 Symbols
3.3 Abbreviations
3.4 Conventions
4 Physical Characteristic Tests
4.1 Contact Pressure
4.2 Curvature Radius of the Contacting Elements
5 Electrical Characteristics Test of UICC-ME Interface
5.1 Test of Voltage Transition Phase
5.2 Electrical Tests on Each Terminal Contact
6 Initial Communication Tests
6.1 ATR
6.2 Clock Stop Mode with 1.8V Technology UICC
6.3 Clock Stop Mode with 3V Technology UICC
6.4 Speed Enhancement
7 Transmission Protocol Tests
7.1 Character Transmission
7.2 T=0 Protocol Test
7.3 T=1 Protocol Test
Annex A (Normative) Functional Requirements of the UICC Simulator
YD/T 1763.1-2011 TD-SCDMA/WCDMA digital cellular mobile telecommunication network test methods for UICC-ME(Cu)interface—Part 1:Physical,electrical and logical characteristics of ME (English Version)
Standard No.
YD/T 1763.1-2011
Status
valid
Language
English
File Format
PDF
Word Count
25000 words
Price(USD)
360.0
Implemented on
2012-2-1
Delivery
via email in 1 business day
Detail of YD/T 1763.1-2011
Standard No.
YD/T 1763.1-2011
English Name
TD-SCDMA/WCDMA digital cellular mobile telecommunication network test methods for UICC-ME(Cu)interface—Part 1:Physical,electrical and logical characteristics of ME
1 Scope
This part specifies test methods and expected results of the physical, electrical and logical characteristics of the UICC-ME (Cu) interface of the ME for TD-SCDMA/WCDMA digital cellular mobile telecommunication network. The specific test items include the physical characteristics of the Cu interface, the electrical characteristics of Cu interface, the initial communication establishment, the transport protocols and application independent procedures.
This part is applicable to the test of UICC-ME (Cu) interface of the ME for TD-SCDMA mobile telecommunication network and that of UICC-ME (Cu) interface of the ME for WCDMA digital cellular mobile telecommunication network. It may be used as reference for CDMA mobile communication ME using UICC.
2 Normative References
The following documents are indispensable for the application of this standard. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
YD/T 1762.1-2011 TD-SCDMA/WCDMA Digital Cellular Mobile Telecommunication Network Technical Requirements for UICC-ME(Cu) Interface - Part 1: Physical, Electrical and Logical Characteristics
ISO/IEC 7816-3 (1997) Identification Cards - Integrated Circuit(s) Cards with Contacts - Part 3: Electronic Signals and Transmission Protocols
3 Terms, Definitions, Symbols, Abbreviations and Conventions
3.1 Terms and Definitions
For the purposes of this standard, the following terms and definitions apply.
3.1.1
3V Technology Smart Card
smart card operating at 3V±10% and 5V± 10%
3.1.2
1.8V Technology Smart Card
smart card operating at 1.8V±10% and 3V±10%
3.1.3
3V Technology Terminal
smart card operating at 3V±10% and 5V±10%
3.1.4
1.8V Technology Terminal
terminal operating the smart card-terminal Cu interface at 1.8V±10% and 3V±10%
3.1.5
Elementary File (EF)
file containing access conditions and data and no other files
3.1.6
File
organized set of bytes or records in the UICC
3.1.7
length of command data, Lc
length of the command data sent by the application layer when processing cases 3 and 4 commands using T=0 protocol
3.1.8
maximum length of response data, Le
maximum length of data expected by the application layer in response to a cases 2 and 4 command using T=0 protocol
3.1.9
length of data sent by the UICC to the terminal, Lr
length of data that the UICC sends to the terminal when processing the response to cases 2 and 4 commands using T=0 protocol
3.1.10
exact length of the data available in the UICC, LUICC
exact length of data available in the UICC to be returned in response to the cases 2 and 4 command using T=0 protocol received by the UICC
Contents of YD/T 1763.1-2011
Foreword i
1 Scope
2 Normative References
3 Terms, Definitions, Symbols, Abbreviations and Conventions
3.1 Terms and Definitions
3.2 Symbols
3.3 Abbreviations
3.4 Conventions
4 Physical Characteristic Tests
4.1 Contact Pressure
4.2 Curvature Radius of the Contacting Elements
5 Electrical Characteristics Test of UICC-ME Interface
5.1 Test of Voltage Transition Phase
5.2 Electrical Tests on Each Terminal Contact
6 Initial Communication Tests
6.1 ATR
6.2 Clock Stop Mode with 1.8V Technology UICC
6.3 Clock Stop Mode with 3V Technology UICC
6.4 Speed Enhancement
7 Transmission Protocol Tests
7.1 Character Transmission
7.2 T=0 Protocol Test
7.3 T=1 Protocol Test
Annex A (Normative) Functional Requirements of the UICC Simulator
