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Position: Chinese Standard in English/YS/T 15-2015
YS/T 15-2015   Test method for thickness of epitaxial layers and diffused layers by angle lap stain (English Version)
Standard No.: YS/T 15-2015 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 3500 words Translation Price(USD):105.0 remind me the price change

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Implemented on:2015-10-1 Delivery: via email in 1~3 business day

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,,2015-10-1,E16956F4E48529231432103259896
Standard No.: YS/T 15-2015
English Name: Test method for thickness of epitaxial layers and diffused layers by angle lap stain
Chinese Name: 硅外延层和扩散层厚度测定 磨角染色法
Chinese Classification: H21    Metal physical property test method
Professional Classification: YS    Professional Standard - Non-ferrous Metal
Source Content Issued by: Ministry of Industry and Information Technology
Issued on: 2015-04-30
Implemented on: 2015-10-1
Status: valid
Superseding:YS/T 15-1991 Thcikness determination for silicon epitaxial layer and difussion layer - Angle lap-stain method
Target Language: English
File Format: PDF
Word Count: 3500 words
Translation Price(USD): 105.0
Delivery: via email in 1~3 business day
本标准规定了测定硅外延层和扩散层厚度的磨角染色法。
本标准适用于外延层和扩散层与衬底导电类型不同或两层电阻率相差至少一个数量级的任意电阻率的硅外延层和扩散层厚度的测量,测量范围:1μm~100μm。
Code of China
Standard
YS/T 15-2015  Test method for thickness of epitaxial layers and diffused layers by angle lap stain (English Version)
Standard No.YS/T 15-2015
Statusvalid
LanguageEnglish
File FormatPDF
Word Count3500 words
Price(USD)105.0
Implemented on2015-10-1
Deliveryvia email in 1~3 business day
Detail of YS/T 15-2015
Standard No.
YS/T 15-2015
English Name
Test method for thickness of epitaxial layers and diffused layers by angle lap stain
Chinese Name
硅外延层和扩散层厚度测定 磨角染色法
Chinese Classification
H21
Professional Classification
YS
ICS Classification
Issued by
Ministry of Industry and Information Technology
Issued on
2015-04-30
Implemented on
2015-10-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
YS/T 15-1991 Thcikness determination for silicon epitaxial layer and difussion layer - Angle lap-stain method
Language
English
File Format
PDF
Word Count
3500 words
Price(USD)
105.0
Keywords
YS/T 15-2015, YS 15-2015, YST 15-2015, YS/T15-2015, YS/T 15, YS/T15, YS15-2015, YS 15, YS15, YST15-2015, YST 15, YST15
Introduction of YS/T 15-2015
本标准规定了测定硅外延层和扩散层厚度的磨角染色法。
本标准适用于外延层和扩散层与衬底导电类型不同或两层电阻率相差至少一个数量级的任意电阻率的硅外延层和扩散层厚度的测量,测量范围:1μm~100μm。
Contents of YS/T 15-2015
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Keywords:
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