![]() |
Chinese Classification
Professional Classification
ICS Classification
Latest
News
Value-added Services
|
| Position: Chinese Standard in English/YS/T 15-2015 |
| YS/T 15-2015 Test method for thickness of epitaxial layers and diffused layers by angle lap stain (English Version) | |||
| Standard No.: | YS/T 15-2015 | Status: | valid remind me the status change
Email: |
| Target Language: | English | File Format: | |
| Word Count: | 3500 words | Translation Price(USD): | 105.0 remind me the price change
Email: |
| Implemented on: | 2015-10-1 | Delivery: | via email in 1~3 business day |
| → | → | → |
| Standard No.: | YS/T 15-2015 |
| English Name: | Test method for thickness of epitaxial layers and diffused layers by angle lap stain |
| Chinese Name: | 硅外延层和扩散层厚度测定 磨角染色法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | YS Professional Standard - Non-ferrous Metal |
| Source Content Issued by: | Ministry of Industry and Information Technology |
| Issued on: | 2015-04-30 |
| Implemented on: | 2015-10-1 |
| Status: | valid |
| Superseding: | YS/T 15-1991 Thcikness determination for silicon epitaxial layer and difussion layer - Angle lap-stain method |
| Target Language: | English |
| File Format: | |
| Word Count: | 3500 words |
| Translation Price(USD): | 105.0 |
| Delivery: | via email in 1~3 business day |
![]() |
| YS/T 15-2015 Test method for thickness of epitaxial layers and diffused layers by angle lap stain (English Version) | |||
| Standard No. | YS/T 15-2015 | ||
| Status | valid | ||
| Language | English | ||
| File Format | |||
| Word Count | 3500 words | ||
| Price(USD) | 105.0 | ||
| Implemented on | 2015-10-1 | ||
| Delivery | via email in 1~3 business day | ||
| Standard No. |
| YS/T 15-2015 |
| English Name |
| Test method for thickness of epitaxial layers and diffused layers by angle lap stain |
| Chinese Name |
| 硅外延层和扩散层厚度测定 磨角染色法 |
| Chinese Classification |
| H21 |
| Professional Classification |
| YS |
| ICS Classification |
| Issued by |
| Ministry of Industry and Information Technology |
| Issued on |
| 2015-04-30 |
| Implemented on |
| 2015-10-1 |
| Status |
| valid |
| Superseded by |
| Superseded on |
| Abolished on |
| Superseding |
| YS/T 15-1991 Thcikness determination for silicon epitaxial layer and difussion layer - Angle lap-stain method |
| Language |
| English |
| File Format |
| Word Count |
| 3500 words |
| Price(USD) |
| 105.0 |
| Keywords |
| YS/T 15-2015, YS 15-2015, YST 15-2015, YS/T15-2015, YS/T 15, YS/T15, YS15-2015, YS 15, YS15, YST15-2015, YST 15, YST15 |
| Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886 | ||
| Copyright: Beijing COC Tech Co., Ltd. 2008-2040 | ||
| Keywords: | ||
| YS/T 15-2015, YS 15-2015, YST 15-2015, YS/T15-2015, YS/T 15, YS/T15, YS15-2015, YS 15, YS15, YST15-2015, YST 15, YST15 | ||