Standard No.:	YS/T 820.19-2012
English Name:	Methods for chemical analysis of laterite nickel ores―Part 19:Determination of aluminum,chromium,iron,magnesium,manganese,nickel and silicon contents―Energy-dispersive X-ray fluorescence spectrometry
Chinese Name:	红土镍矿化学分析方法 第19部分：铝、铬、铁、镁、锰、镍和硅量的测定 能量色散X射线荧光光谱法
Chinese Classification:	D04    Basic standard and general method
Professional Classification:	YS    Professional Standard - Non-ferrous Metal
Source Content Issued by:	Ministry of Industry and Information Technology
Issued on:	2012-11-07
Implemented on:	2013-3-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	7500 words
Translation Price(USD):	220.0
Delivery:	via email in 1 business day

Methods for chemical analysis of laterite nickel ores — Part 19: Determination of aluminum, chromium, iron, magnesium, manganese, nickel and silicon contents — Energy-dispersive X-ray fluorescence spectrometry 1 Scope This part of YS/T 820 specifies methods for the determination of aluminum, chromium, iron, magnesium, manganese, nickel and silicon contents in laterite nickel ores by energy-dispersive X-ray fluorescence spectrometer. This part is applicable to the determination of aluminum, chromium, iron, magnesium, manganese, nickel and silicon contents in laterite nickel ores. See Table 1 for the determination range. Note: The contents of aluminum, chromium, iron, magnesium, manganese, nickel and silicon contents in laterite nickel ores can also be determined using the method in Annex A. Table 1 Element and its determination range 2 Method summary The powder specimen is pressed or prepared into glass melt piece, which is placed in the ray beam emitted by the X-ray source. When the sample is excited, the fluorescent X-ray intensity generated is measured by the analysis device, and the content of the element to be measured is calculated through the calibration curve.   3 Interferences 3.1 When each element in the laterite nickel ore sample emits X-ray and produces spectral interference, the detector cannot correctly detect the X-ray emitted by the element to be detected, resulting in spectral superposition and spectral interference. Calibrate the instrument according to the operating instructions of the instrument manufacturer to eliminate interference. 3.2 The change of element content in the sample may change the matrix and directly affect the X-ray absorption, thus changing the measurement results of each element. This interference usually occurs in X-ray fluorescence analysis, but it is not the spectral interference. 3.3 Some instruments are equipped with interference reduction software, which can automatically check and reduce interference. 4 Instruments and equipment 4.1 Energy-dispersive X-ray fluorescence spectrometer: Any energy-dispersive X-ray fluorescence spectrometer that can be used in this test method and meets the following conditions may be used. 4.1.1 X-ray excitation source: molybdenum target, antimony target, palladium target, silver target, gadolinium target, tungsten target or gold target X-ray tubes. The excitation energy is 4keV ~ 50keV or higher. Programmable control can be used to selectively excite the sample and simplify the sample spectrum. Note: When using X-rays for testing, analysts shall comply with the safety instructions of the instrument manufacturers as well as national and local safety regulations. 4.1.2 X-ray detector with resolution below 155eV (Mn-Kα).

Foreword i 1 Scope 2 Method summary 3 Interferences 4 Instruments and equipment 5 Preparation of specimen 6 Calibration and standardization 7 Analytical procedures 8 Expression of results 9 Precision 10 Test report Annex A (Informative) Molten slide method Annex B (Informative) Working conditions for instruments