2025-12-14 216.73.216.3
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Chinese National Standard List: Metal physical property test method

GB/T 42676-2023 Test method for crystalline quality of semiconductive single crystal―X-ray diffraction method 
  Issued on: 2023-08-06   Translation Price(USD): 165.0
GB/T 42902-2023 Test method for surface defects on silicon carbide epitaxial wafers―Laser scattering method 
  Issued on: 2023-08-06   Translation Price(USD): 255.0
GB/T 42905-2023 Test method for thickness of silicon carbide epitaxial layer―Infrared reflectance method 
  Issued on: 2023-08-06   Translation Price(USD): 165.0
GB/T 42789-2023 Test method for gloss of silicon wafer 
  Issued on: 2023-08-06   Translation Price(USD): 165.0
GB/T 1553-2023 Test methods for minority carrier lifetime in bulk silicon and germanium—Photoconductivity decay method 
  Issued on: 2023-08-06   Translation Price(USD): 465.0
GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal 
  Issued on: 2023-08-06   Translation Price(USD): 170.0
GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge 
  Issued on: 2023-08-06   Translation Price(USD): 225.0
SN/T 5496-2023 Evaluation of fatigue properties of metal materialsNonlinear ultrasonic method 
  Issued on: 2023-5-5   Translation Price(USD): 135.0
GB/T 42514-2023 Corrosion evaluation for anodic oxide coatings and organic polymer coatings on aluminium and its alloys—Chart method  
  Issued on: 2023-05-23   Translation Price(USD): 315.0
GB/T 42544-2023 Corrosion evaluation for anodic oxide coatings and organic polymer coatings on aluminium and its alloys—Grid method  
  Issued on: 2023-05-23   Translation Price(USD): 105.0
GB/T 41765-2022 Test method for dislocation density of monocrystalline silicon carbide 
  Issued on: 2022-10-12   Translation Price(USD): 225.0
GB/T 42271-2022 Test method for resistivity of semi-insulating monocrystalline silicon carbide by contactless measurement 
  Issued on: 2022-12-30   Translation Price(USD): 165.0
GB/T 41079.2-2022 Test methods for physical properties of liquid metals—Part 2: Determination of electrical conductivity 
  Issued on: 2022-10-12   Translation Price(USD): 120.0
GB/T 41751-2022 Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers 
  Issued on: 2022-10-12   Translation Price(USD): 165.0
GB/T 3656-2022 Methods of coercivity measurement of magnetic iron and magnetically soft alloy by pulling out procedure 
  Issued on: 2022-10-14   Translation Price(USD): 165.0
GB/T 2523-2022 Measuring method of surface roughness, peak count and waviness for cold-rolled metal sheet and strip  
  Issued on: 2022-7-11   Translation Price(USD): 255.0
GB/T 3655-2022 Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of an epstein frame 
  Issued on: 2022-10-12   Translation Price(USD): 480.0
GB/T 3658-2022 Methods of measurement of the magnetic properties of magnetically soft metallic and powder materials at frequencies in the range 20 Hz to 100 kHz by the use of ring specimens 
  Issued on: 2022-10-12   Translation Price(USD): 345.0
GB/T 32280-2022 Test method for warp and bow of silicon wafers—Automated non-contact scanning method 
  Issued on: 2022-03-09   Translation Price(USD): 255.0
GB/T 41155-2021 Sintered metal materials,excluding hardmetals—Fatigue test pieces 
  Issued on: 2021-12-31   Translation Price(USD): 180.0
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