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| Chinese National Standard Category: Reliability and maintainability |
| English Title: | Resistive memory cell electrical parameter test sepcification |
| Chinese Title: | 阻变存储单元电学测试规范 |
| Standard No.: | T/CIE 148-2022 |
| Category No.: | L05 |
| Issued by: | CIE |
| Issued on: | 2022-12-31 |
| Implemented on: | |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 5500 words |
| Similar Standards: | GB 6993-1986 GB/T 43038-2023 GB/T 43037-2023 GB/T 43039-2023 T/CIE 144-2022 T/CIE 148-2022 T/CIE 150-2022 GB/T 39844-2021 GB/T 37981-2019 GB/T 37963-2019 GB/T 37407-2019 GB/T 37079-2018 GB/T 37084-2018 GB/T 36657-2018 GB/T 36615-2018 GB 6990-1986 GB 6991-1986 GB/T 36467-2018 GB/T 15174-2017 GB 5080.6-1985 |
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