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| Position: Chinese Standard in English/GB/T 13388-2009 |
| GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques (English Version) | |||
| Standard No.: | GB/T 13388-2009 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 6000 words | Translation Price(USD): | 180.0 remind me the price change |
| Implemented on: | 2010-6-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 13388-2009 |
| English Name: | Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques |
| Chinese Name: | 硅片参考面结晶学取向X射线测试方法 |
| Chinese Classification: | H80 Semimetal and semiconductor material in general |
| Professional Classification: | GB National Standard |
| ICS Classification: | 29.045 Semiconducting materials |
| Source Content Issued by: | AQSIQ; SAC |
| Issued on: | 2009-10-30 |
| Implemented on: | 2010-6-1 |
| Status: | valid |
| Superseding: | GB/T 13388-1992 Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques |
| Target Language: | English |
| File Format: | |
| Word Count: | 6000 words |
| Translation Price(USD): | 180.0 |
| Delivery: | via email in 1~3 business day |