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Position: Chinese Standard in English/GB/T 14849.4-2014
GB/T 14849.4-2014   Methods for chemical analysis of silicon metal - Part 4:Determination of impurity contents - Inductively coupled plasma atomic emission spectrometric method (English Version)
Standard No.: GB/T 14849.4-2014 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 6000 words Translation Price(USD):120.0 remind me the price change

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Implemented on:2015-8-1 Delivery: via email in 1~3 business day

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Standard No.: GB/T 14849.4-2014
English Name: Methods for chemical analysis of silicon metal - Part 4:Determination of impurity contents - Inductively coupled plasma atomic emission spectrometric method
Chinese Name: 工业硅化学分析方法 第4部分:杂质元素含量的测定 电感耦合等离子体原子发射光谱法
Chinese Classification: H12    Light metals and their alloys analysis method
Professional Classification: GB    National Standard
ICS Classification: 77.120.10 77.120.10    Aluminium and aluminium alloys 77.120.10
Source Content Issued by: AQSIQ; SAC
Issued on: 2014-12-05
Implemented on: 2015-8-1
Status: valid
Superseding:GB/T 14849.4-2008 for chemical analysis of silicon metal - Part 4: Determination of elements content Inductively coupled plasma atomic emission spectrometric method
Target Language: English
File Format: PDF
Word Count: 6000 words
Translation Price(USD): 120.0
Delivery: via email in 1~3 business day
Code of China
Standard
GB/T 14849.4-2014  Methods for chemical analysis of silicon metal - Part 4:Determination of impurity contents - Inductively coupled plasma atomic emission spectrometric method (English Version)
Standard No.GB/T 14849.4-2014
Statusvalid
LanguageEnglish
File FormatPDF
Word Count6000 words
Price(USD)120.0
Implemented on2015-8-1
Deliveryvia email in 1~3 business day
Detail of GB/T 14849.4-2014
Standard No.
GB/T 14849.4-2014
English Name
Methods for chemical analysis of silicon metal - Part 4:Determination of impurity contents - Inductively coupled plasma atomic emission spectrometric method
Chinese Name
工业硅化学分析方法 第4部分:杂质元素含量的测定 电感耦合等离子体原子发射光谱法
Chinese Classification
H12
Professional Classification
GB
ICS Classification
Issued by
AQSIQ; SAC
Issued on
2014-12-05
Implemented on
2015-8-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
GB/T 14849.4-2008 for chemical analysis of silicon metal - Part 4: Determination of elements content Inductively coupled plasma atomic emission spectrometric method
Language
English
File Format
PDF
Word Count
6000 words
Price(USD)
120.0
Keywords
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Introduction of GB/T 14849.4-2014
Contents of GB/T 14849.4-2014
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