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Position: Chinese Standard in English/GB/T 17723-1999
GB/T 17723-1999   Surface composition analysis method of gold-plated products by EDX (English Version)
Standard No.: GB/T 17723-1999 Status:superseded remind me the status change

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Target Language:English File Format:PDF
Word Count: 3000 words Translation Price(USD):264.0 remind me the price change

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Implemented on:1999-1-2 Delivery: via email in 1~3 business day

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,2009-5-1,1999-1-2,6C3830FBD29C1ECC1422614139728
Standard No.: GB/T 17723-1999
English Name: Surface composition analysis method of gold-plated products by EDX
Chinese Name: 黄金制品镀层成分的 X 射线能谱测量方法
Chinese Classification: N33    Electron optics and other physical optics instrument
Professional Classification: GB    National Standard
Source Content Issued by: CSBTS
Issued on: 1999-04-01
Implemented on: 1999-1-2
Status: superseded
Superseded by:GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
Superseded on:2009-5-1
Target Language: English
File Format: PDF
Word Count: 3000 words
Translation Price(USD): 264.0
Delivery: via email in 1~3 business day
本标准规定了应用扫描电镜X射线能谱仪(包括装有X射线能谱仪的电子探针仪)对镀金制品表面金及金合金单层均匀镀层成分的非破坏性分析测量方法。本标准适用于表面镀金及金合金,其镀层厚度为0.2μm以上,3μm以下范围内的成分测量(不包括基体和金镀层材料相近的镀层成分的测量)。
Code of China
Standard
GB/T 17723-1999  Surface composition analysis method of gold-plated products by EDX (English Version)
Standard No.GB/T 17723-1999
Statussuperseded
LanguageEnglish
File FormatPDF
Word Count3000 words
Price(USD)264.0
Implemented on1999-1-2
Deliveryvia email in 1~3 business day
Detail of GB/T 17723-1999
Standard No.
GB/T 17723-1999
English Name
Surface composition analysis method of gold-plated products by EDX
Chinese Name
黄金制品镀层成分的 X 射线能谱测量方法
Chinese Classification
N33
Professional Classification
GB
ICS Classification
Issued by
CSBTS
Issued on
1999-04-01
Implemented on
1999-1-2
Status
superseded
Superseded by
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
Superseded on
2009-5-1
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
3000 words
Price(USD)
264.0
Keywords
GB/T 17723-1999, GB 17723-1999, GBT 17723-1999, GB/T17723-1999, GB/T 17723, GB/T17723, GB17723-1999, GB 17723, GB17723, GBT17723-1999, GBT 17723, GBT17723
Introduction of GB/T 17723-1999
本标准规定了应用扫描电镜X射线能谱仪(包括装有X射线能谱仪的电子探针仪)对镀金制品表面金及金合金单层均匀镀层成分的非破坏性分析测量方法。本标准适用于表面镀金及金合金,其镀层厚度为0.2μm以上,3μm以下范围内的成分测量(不包括基体和金镀层材料相近的镀层成分的测量)。
Contents of GB/T 17723-1999
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Keywords:
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