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| Position: Chinese Standard in English/JB/T 6842-1993 |
| JB/T 6842-1993 Test Method of Scanning Electron Microscope (English Version) | |||
| Standard No.: | JB/T 6842-1993 | Status: | abolished remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 5000 words | Translation Price(USD): | 150.0 remind me the price change |
| Implemented on: | 1994-1-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | JB/T 6842-1993 |
| English Name: | Test Method of Scanning Electron Microscope |
| Chinese Name: | 扫描电子显微镜 试验方法 |
| Chinese Classification: | N33 Electron optics and other physical optics instrument |
| Professional Classification: | JB Professional Standard - Machinery |
| Source Content Issued by: | Ministry of Machine Building |
| Issued on: | 1993-7-9 |
| Implemented on: | 1994-1-1 |
| Status: | abolished |
| Abolished on: | 2017-05-12 |
| Superseding: | ZB Y340-1985 |
| Target Language: | English |
| File Format: | |
| Word Count: | 5000 words |
| Translation Price(USD): | 150.0 |
| Delivery: | via email in 1~3 business day |