SJ/T 11212-1999 English Version, SJ/T 11212-1999 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD) (English Version)

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SJ/T 11212-1999 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD) (English Version)
Standard No.:	SJ/T 11212-1999	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	7000 words	Translation Price(USD):	210.0 remind me the price change Email:
Implemented on:	1999-12-1	Delivery:	via email in 1~3 business day

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Standard No.:	SJ/T 11212-1999
English Name:	Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
Chinese Name:	石英晶体元件参数的测量第6部分：激励电平相关性（DLD）的测量
Chinese Classification:	L21 Quartz crystal and piezoelectric element
Professional Classification:	SJ Professional Standard - Electronics
Source Content Issued by:	MIIT
Issued on:	1999-8-26
Implemented on:	1999-12-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	7000 words
Translation Price(USD):	210.0
Delivery:	via email in 1~3 business day

Standard

SJ/T 11212-1999 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD) (English Version)
Standard No.	SJ/T 11212-1999
Status	valid
Language	English
File Format	PDF
Word Count	7000 words
Price(USD)	210.0
Implemented on	1999-12-1
Delivery	via email in 1~3 business day

Detail of SJ/T 11212-1999

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Introduction of SJ/T 11212-1999

本规范适用于石英晶体件激励电平相关性（DLD）的测量。本标准规定两种试验方法。方法A，以SJ/Z9154.1-87的π型网络为基础，适宜和于该标覆盖的整个频率范围。方法B，是振荡器法，适用于固定条件下大批量基频石英晶体件的测量。

Contents of SJ/T 11212-1999

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