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| Position: Chinese Standard in English/YS/T 14-1991 |
| YS/T 14-1991 Test method for thickness of heteroepitaxy layers and polycrystalline layers (English Version) | |||
| Standard No.: | YS/T 14-1991 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 1500 words | Translation Price(USD): | 45.0 remind me the price change |
| Implemented on: | 1992-6-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | YS/T 14-1991 |
| English Name: | Test method for thickness of heteroepitaxy layers and polycrystalline layers |
| Chinese Name: | 异质外延层和硅多晶层厚度的测量方法 |
| Chinese Classification: | H82 Elemental semiconductor material |
| Professional Classification: | YS Professional Standard - Non-ferrous Metal |
| Issued on: | 1991-04-26 |
| Implemented on: | 1992-6-1 |
| Status: | superseded |
| Superseded by: | YS/T 14-2015 |
| Superseded on: | 2015-10-1 |
| Target Language: | English |
| File Format: | |
| Word Count: | 1500 words |
| Translation Price(USD): | 45.0 |
| Delivery: | via email in 1~3 business day |