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Position: Chinese Standard in English/YS/T 14-2015
YS/T 14-2015   Test method for thickness of heteroepitaxy layers and polycrystalline layers (English Version)
Standard No.: YS/T 14-2015 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 3500 words Translation Price(USD):144.0 remind me the price change

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Implemented on:2015-10-1 Delivery: via email in 1~3 business day

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,,2015-10-1,1DD1C73DCBF2A8E91432103258893
Standard No.: YS/T 14-2015
English Name: Test method for thickness of heteroepitaxy layers and polycrystalline layers
Chinese Name: 异质外延层和硅多晶层厚度的测量方法
Professional Classification: YS    Professional Standard - Non-ferrous Metal
Source Content Issued by: Ministry of Industry and Information Technology
Issued on: 2015-04-30
Implemented on: 2015-10-1
Status: valid
Superseding:YS/T 14-1991
Target Language: English
File Format: PDF
Word Count: 3500 words
Translation Price(USD): 144.0
Delivery: via email in 1~3 business day
本标准规定了异质外延层和硅多晶层厚度的测量方法。
本标准适用于测量衬底与沉积层之间界面层厚度小于100nm的异质外延层和硅多晶层的厚度,测量范围为1μm~100μm。
Code of China
Standard
YS/T 14-2015  Test method for thickness of heteroepitaxy layers and polycrystalline layers (English Version)
Standard No.YS/T 14-2015
Statusvalid
LanguageEnglish
File FormatPDF
Word Count3500 words
Price(USD)144.0
Implemented on2015-10-1
Deliveryvia email in 1~3 business day
Detail of YS/T 14-2015
Standard No.
YS/T 14-2015
English Name
Test method for thickness of heteroepitaxy layers and polycrystalline layers
Chinese Name
异质外延层和硅多晶层厚度的测量方法
Chinese Classification
Professional Classification
YS
ICS Classification
Issued by
Ministry of Industry and Information Technology
Issued on
2015-04-30
Implemented on
2015-10-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
YS/T 14-1991
Language
English
File Format
PDF
Word Count
3500 words
Price(USD)
144.0
Keywords
YS/T 14-2015, YS 14-2015, YST 14-2015, YS/T14-2015, YS/T 14, YS/T14, YS14-2015, YS 14, YS14, YST14-2015, YST 14, YST14
Introduction of YS/T 14-2015
本标准规定了异质外延层和硅多晶层厚度的测量方法。
本标准适用于测量衬底与沉积层之间界面层厚度小于100nm的异质外延层和硅多晶层的厚度,测量范围为1μm~100μm。
Contents of YS/T 14-2015
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Keywords:
YS/T 14-2015, YS 14-2015, YST 14-2015, YS/T14-2015, YS/T 14, YS/T14, YS14-2015, YS 14, YS14, YST14-2015, YST 14, YST14