| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| GB/T 20870.1-2007 |
Semiconductor devices-Part 16-1:Microwave integrated circuits-Amplifiers |
$450.00 |
via email in 1~3 business day |
valid,,2007-9-1 |
|
| GB/T 249-1989 |
The rule of type designation for discrete semiconductor |
$184.00 |
via email in 1~3 business day |
superseded,2017-12-1,1990-4-1 |
|
| GB/T 249-2017 |
The rule of type designation for discrete semiconductor devices |
$70.00 |
via email in 1~3 business day |
valid,,2017-12-1 |
|
| GB/T 29827-2013 |
Information security technology—Trusted computing specification—Motherboard function and interface of trusted platform |
$600.00 |
via email in 1~3 business day |
valid,,2014-2-1 |
|
| GB/T 42706.2-2023 |
Electronic components—Long-term storage of electronic semiconductor devices—Part 2：Deterioration mechanisms |
$285.00 |
via email in 1~3 business day |
valid,,2023-9-1 |
|
| GB/T 42706.5-2023 |
Electronic components—Long-term storage of electronic semiconductor devices—Part 5：Die and wafer devices |
$285.00 |
via email in 1~3 business day |
valid,,2023-9-1 |
|
| GB/T 42709.19-2023 |
Semiconductor devices―Micro-electromechanical devices―Part 19:Electronic compasses |
$435.00 |
via email in 1~5 business day |
valid,,2024-3-1 |
|
| GB/T 42709.5-2023 |
Semiconductor devices—Micro-electromechanical devices—Part 5: RF MEMS switches |
$495.00 |
via email in 1~5 business day |
valid,,2023-9-1 |
|
| GB/T 42709.7-2023 |
Semiconductor devices—Micro-electromechanical devices—Part 7: MEMS BAW filter and duplexer for radio frequency control and selection |
$375.00 |
via email in 1~5 business day |
valid,,2023-12-1 |
|
| GB/T 45716-2025 |
Semiconductor devices—Bias temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs) |
$270.00 |
via email in 1~3 business day |
to be valid,,2025-9-1 |
|
| GB/T 45718-2025 |
Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for inter-metal layers |
$315.00 |
via email in 1~5 business day |
to be valid,,2025-9-1 |
|
| GB/T 45719-2025 |
Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors |
$270.00 |
via email in 1~3 business day |
to be valid,,2025-9-1 |
|
| GB/T 45721.1-2025 |
Semiconductor devices—Stress migration test—Part 1: Copper stress migration test |
$435.00 |
via email in 1~5 business day |
to be valid,,2025-9-1 |
|
| GB/T 45722-2025 |
Semiconductor devices—Constant current electromigration test |
$270.00 |
via email in 1~3 business day |
to be valid,,2025-9-1 |
|
| GB/T 4587-2023 |
Semiconductor devices—Discrete devices—Part 7:Bipolar transistors |
$1275.00 |
via email in 1~5 business day |
valid,,2024-4-1 |
|
| GB/T 4589.1-1989 |
Semiconductor devices Generic specification for discrete devices and integrated circuits |
$810.00 |
via email in 1~5 business day |
superseded,2007-2-1,1990-1-1 |
|
| GB/T 4589.1-2006 |
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
$420.00 |
via email in 1~3 business day |
valid,,2007-2-1 |
|
| GB/T 4937-1995 |
Mechanical and climatic test methods for semiconductor devices |
$480.00 |
via email in 1~5 business day |
superseded,2007-2-1,1996-8-1 |
|
| GB/T 4937.1-2006 |
Semiconductor devices - Mechanical and climatic test methods - Part 1 : General |
$75.00 |
via email in 1~3 business day |
valid,,2007-2-1 |
|
| GB/T 4937.11-2018 |
Semiconductor devices—Mechanical and climatic test methods—Part 11:Rapid change of temperature—Two-fluid-bath method |
$80.00 |
via email in 1~3 business day |
valid,,2019-1-1 |
|
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