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| Chinese National Standard Category: Metal physical property test method |
| English Title: | Test method for dislocation imaging in III-nitride semiconductor materials—Transmission electron microscopy |
| Chinese Title: | III族氮化物半导体材料中位错成像的测试 透射电子显微镜法 |
| Standard No.: | GB/T 44558-2024 |
| Category No.: | H21 |
| Issued by: | SAMR, SAC |
| Issued on: | 2024-09-29 |
| Implemented on: | 2025-4-1 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 9000 words |
| Similar Standards: | T/ZSA 231-2024 GB/T 14847-2025 YS/T 273.2-2006 YS/T 535.2-2009 YS/T 581.5-2006 YS/T 581.6-2006 YS/T 581.10-2006 GB/T 46227-2025 GB/T 20831-2025 GB/T 5161-2025 GB/T 19444-2025 GB/T 6148-2025 GB/T 6147-2025 GB/T 41079.3-2024 GB/T 44558-2024 GB/T 44330-2024 GB/T 24578-2024 GB/T 43894.1-2024 GB/T 8758-1988 GB/T 6522-1986 |
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