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Code of China
Chinese National Standard List: Semimetal and semiconductor material in general

GB/T 24574-2009 Test methods for photoluminescence analysis of single crystal silicon for Ⅲ-Ⅴ impurities 
  Issued on: 2009-10-30   Translation Price(USD): 210.0
GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices 
  Issued on: 2009-10-30   Translation Price(USD): 180.0
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy 
  Issued on: 2012-12-31   Translation Price(USD): 270.0
GB/T 29505-2013 Test method for measuring surface roughness on planar surfaces of silicon wafer 
  Issued on: 2013-5-9   Translation Price(USD): 430.0
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal 
  Issued on: 2009-10-30   Translation Price(USD): 150.0
GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge 
  Issued on: 2009-10-30   Translation Price(USD): 150.0
GB/T 14863-2013 Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes 
  Issued on: 2013-12-31   Translation Price(USD): 210.0
GB/T 6619-2009 Test methods for bow of silicon wafers 
  Issued on: 2009-10-30   Translation Price(USD): 180.0
GB/T 24579-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy 
  Issued on: 2009-10-30   Translation Price(USD): 210.0
GB/T 6621-2009 Testing methods for surface flatness of silicon slices 
  Issued on: 2009-10-30   Translation Price(USD): 110.0
GB/T 34479-2017 Specification for alphanumeric marking of silicon wafers 
  Issued on: 2017-10-14   Translation Price(USD): 210.0
GB/T 4061-2009 Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion 
  Issued on: 2009-10-30   Translation Price(USD): 80.0
GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry 
  Issued on: 2009-10-30   Translation Price(USD): 120.0
GB/T 14139-2009 Silicon epitaxial wafers 
  Issued on: 2009-10-30   Translation Price(USD): 180.0
GB/T 1558-2009 Test method for substitutional atomic carbon concent of silicon by infrared absorption 
  Issued on: 2009-10-30   Translation Price(USD): 150.0
GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon 
  Issued on: 2009-10-30   Translation Price(USD): 360.0
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