Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
GB/T 44334-2024 |
Silicon epitaxial wafers with buried layers |
$270.00 |
via email in 1~3 business day |
valid,,2025-3-1 |
|
GB/T 5238-2019 |
Monocrystalline germanium and monocrystalline germanium slices |
$160.00 |
via email in 1~3 business day |
valid,,2020-5-1 |
|
GB/T 6616-2009 |
Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge |
$150.00 |
via email in 1~3 business day |
superseded,2024-3-1,2010-6-1 |
|
GB/T 6617-2009 |
Test method for measuring resistivity of silicon wafer using spreading resistance probe |
$150.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
GB/T 6618-2009 |
Test method for thickness and total thickness variation of silicon slices |
$180.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
GB/T 6619-2009 |
Test methods for bow of silicon wafers |
$180.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
GB/T 6620-2009 |
Test method for measuring warp on silicon slices by noncontact scanning |
$180.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
GB/T 6621-2009 |
Testing methods for surface flatness of silicon slices |
$110.00 |
via email in 1~3 business day |
valid,,2010-6-1 |
|
GB/T 8646-1998 |
Fine aluminum-1% silicon wire for semiconductor lend-bonding |
$264.00 |
via email in 1~3 business day |
abolished2007-09-29,2006-10-11,1999-2-1 |
|
GB/T 8750-1997 |
Gold wire for semiconductor devices lead bonding |
$180.00 |
via email in 1~3 business day |
abolished2008-06-01,2008-6-1,1998-8-1 |
|
GB/T 8756-2018 |
Collection of metallographs on defects of germanium crystal |
$610.00 |
via email in 1~5 business day |
valid,,2019-7-1 |
|
SJ 20866-2003 |
Specification for cross-pressing molybdenum-rhenium alloy pieces |
$100.00 |
via email in 1~3 business day |
valid,,2004-3-1 |
|
SJ/T 11396-2009 |
The sapphire substrates for nitride based light-emitting diode |
$190.00 |
via email in 1~3 business day |
valid,,2010-1-1 |
|
T/CEMIA 023-2021 |
Quartz crucible for semiconductor monosilicon growth |
$225.00 |
via email in 1~3 business day |
valid,, |
|
T/CEMIA 024-2021 |
Quartz crucible manufacturing practices for semiconductor monosilicon growth |
$165.00 |
via email in 1~3 business day |
valid,, |
|
YS 68-2004 |
Arsenic |
$60.00 |
via email in 1~3 business day |
abolished2015-04-01,2015-4-1,2004-11-1 |
|
YS/T 1061-2015 |
Silicon core for polysilicon by improved siemens method |
$105.00 |
via email in 1~3 business day |
abolished2025-05-01,2025-5-1,2015-10-1 |
|
YS/T 13-2015 |
High pure germanium tetrachloride |
$225.00 |
via email in 1~3 business day |
valid,,2015-10-1 |
|
YS/T 15-1991 |
Thcikness determination for silicon epitaxial layer and difussion layer - Angle lap-stain method |
$90.00 |
via email in 1~3 business day |
superseded,2015-10-1,1992-6-1 |
|
YS/T 222-1996 |
Tellurium ingots |
$105.00 |
via email in 1~3 business day |
superseded,2011-3-1,1993-3-1 |
|
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* Related standard quantity: * Page quantity: *
Current: * First
Previous
[2][3][4][5][6][7][8][9]
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